292nm Pitch High Magnification, High Resolution Calibration Standard for SEM, Auger and FIB

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Description

292nm Pitch High Magnification, High Resolution Calibration Standard for SEM, Auger and FIBDESCRIPTION Precision holographic grating standard with high contrast and excellent edge definition. Period: 292nm pitch nominal, one dimensional array. Accuracy is + 1%. Calibration certificate will give the actual pitch of the standard. Surface structure: Titanium lines on Silicon, 4x3mm dimensions. Line height (about 30nm) and line width (130nm) are not calibrated. Usability: The calibrated pattern covers the entire chip. There is sufficient usable

Size of wide post is 250 x 35 x 190µm (W x D x H)

PELCO® Tabbed Pinpointer Grids

5mm square and is unmounted

MLCT probes have less than 2deg of cantilever bend

unknown hazard if any

Available in coarser mesh sizes only

This AFM probe is unmounted for use on any AFM and is also available with Aluminum reflex coating as model RESPA-20

It uses two metal spring clips to hold the sample

the diamond-like carbon (DLC) coated probes

For use on PeakForce QNM enabled AFMs only

High spring constant for contact resonance on hardest materials such s ceramics

Low vertical edge height