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Description

RMN-25PT300BMETAL PROBE, 300UM, 18N M, 20KHZ DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Solid Metal Probe, 18 N m, 20 kHz RockyMountain Nanotechnology (RMN) probes are uniquely constructed from pureplatinum and placed on a standard AFM probe sized ceramic substrate. Solid metal probes offer excellent conductivity and suffer no thin filmadhesion problems that occur with metal coated silicon probes. Theseprobes also have a tip radius (< 20 nm) which

Cantilever Material: Diamond nmech probe

Quantitative and repeatable measurements for over 24 hours of continuous use have been demonstrated with these probes

The legacy SCM-PIC is still available for ordering while supplies last

This AFM probe is unmounted for use on any AFM and is also available without Aluminum reflex coating as model RFESP-75

Al reflective coating DESCRIPTION

By using wear-resistant sharp diamond probes the contact size is well characterized and stays constant during mechanical measurements

Max Width = 300 nm

53 Cantilever Geometry: Special Cantilevers Number: 1 Back Side Coating: Reflective Aluminum

The MESP-HM-V2 has a nominal coercivity of 400 Oe (medium)

ICONEC-V2-POT-100V

overhang) and largevolumeproduction to undercut applications

Bruker’s new line of LTESP high quality premium etched silicon probes set the industry standard for long-lever TappingMode™ and non-contact mode in air

Exchange/Return Notes