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Description

ContGD-GGold Coated Contact Mode AFM Probe DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Gold Coated Contact Mode AFM Probe Monolithic silicon AFM probe for contact mode and lateral force mode operation. The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius ensures good resolution and reproducibility. The AFM holder chip fits most commercial AFM systems as it is industry standard size. AFM Tip

15389-P - Wafer Holder for 100mm dia

Front Surface: Polished

Width x Thickness 5385-1SU PELCO® Pro Superalloy

which results in aperture dimensions:

16526 - High Purity Vitreous Carbon Planchet 25mm dia

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Maximum gap is 11mm (7/16")

Width x Thickness 5385-55SU PELCO® Pro Superalloy

Replacement Tips 2X Carbofib 2mm x 0

this holder also accepts a standard 12

which is particularly suitable for use with DAPI and Alexa dye-stained materials

Additional markings for 30°